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Database with abstracts and citations of research literature and quality web sources, including journals, conference proceedings, trade publications, abstracts, and patent records. A multidisciplinary resource covering materials from the humanities, sciences and social sciences. Also indexes EMBASE and allows you to locate the most highly cited items and the articles that cite them.
Date Coverage: 1970-present; selected access back to 1823
This multi-disciplinary database provides full text for more than an abundance of journals and covers extensive academic disciplines and provides comprehensive content, including PDF back-files, videos, and searchable cited references.
Contains 4,600 journals, including full text for nearly 3,900 peer-reviewed titles. PDF backfiles are available for well over one hundred journals, and searchable cited references are provided for more than 1,000 titles.
Date Coverage:Varies; primarily 1970s-present with some titles covering earlier dates
Indexes thousands of scholarly journals, books, reports, conferences and more. Citation information and analysis with cited reference searching available. The collection includes Science Citation Index Expanded (1990-present), Social Sciences Citation Index Expanded (1990-present), Arts & Humanities Citation Index (1990-present), Conference Proceedings Citation Index (1990-present), Book Citation Index (2005-present), Current Chemical Reactions (1985-present) and Index Chemicus (1993-present).
Date Coverage: Varies by collection
Maximum Users: Unlimited
Search through Elsevier journals, books, reference works, and images for the Physical Silences, Engineering, Life Sciences, Health Sciences, Social Sciences and Humanities. Full-text access is available only for MU currently subscribed titles and a few backfiles of non-subscribed titles.
Access to IET/IEE (Institution of Engineering and Technology) Journals and IEEE (Institute of Electrical and Electronics Engineers) transactions, journals, magazines, and conference proceedings and all current IEEE standards.